发明名称 CHARGED PARTICLE BEAM DEVICE, AND ASTIGMATISM CORRECTION ADJUSTING METHOD IN IT
摘要 PROBLEM TO BE SOLVED: To provide a highly accurate astigmatism correction adjusting method capable of obtaining stable image quality without depending on a pattern or a sample used for astigmatism adjustment and without relying on skill of a worker, in a charged particle beam device. SOLUTION: A digital image is obtained by simultaneously changing the amounts of excitation in the X direction and Y direction of the astigmatism correcting coil of the charged particle beam device, a numerical normalization process is applied to the image, image quality of the image is numerically expressed, error components by influence of noise and vibration is removed from the numerical value by approximate processing, and an astigmatism correction amount having a small quantity of astigmatism is thereby estimated. COPYRIGHT: (C)2009,JPO&INPIT
申请公布号 JP2009037737(A) 申请公布日期 2009.02.19
申请号 JP20070198279 申请日期 2007.07.31
申请人 HITACHI HIGH-TECHNOLOGIES CORP 发明人 SAKA TADAMA;OBARA KENJI;HIRAI TOMOHIRO;YAMAGUCHI KOHEI
分类号 H01J37/153;H01J37/28 主分类号 H01J37/153
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