发明名称 METHOD FOR MANUFACTURING A DEVICE HAVING A HIGH ASPECT RATIO VIA
摘要 Method for manufacturing a device having a conductive via includes the following steps. A dielectric material layer including a through hole is formed on a substrate. A seed metallic layer is formed on the dielectric material layer and in the through hole. A metallic layer is formed on the seed metallic layer, and is filled in the through hole. The metallic layer located over the seed metallic layer and outside the through hole is etched by a spin etching process, whereby the metallic layer located in the through hole is formed to a lower portion. An upper portion is formed on the lower portion, and a metallic trace is formed on the seed metallic layer, wherein the upper and lower portions is formed to a conductive via, and the conductive via and the metallic trace expose a part of the seed metallic layer. The exposed seed metallic layer is etched.
申请公布号 US2009047782(A1) 申请公布日期 2009.02.19
申请号 US20080170138 申请日期 2008.07.09
申请人 ADVANCED SEMICONDUCTOR ENGINEERING, INC. 发明人 YANG HSUEH AN;CHENG PO JEN
分类号 H01L21/44 主分类号 H01L21/44
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