发明名称 System mit kontrolliertem Sauerstoffgehalt und Verfahren zum Regeln der Widerstandseigenschaften eines Speicherbauelements
摘要 A memory cell and method for controlling the resistance properties in a memory material are provided. The method comprises: forming manganite; annealing the manganite in an oxygen atmosphere; controlling the oxygen content in the manganite in response to the annealing; and, controlling resistance through the manganite in response to the oxygen content. The manganite is perovskite-type manganese oxides with the general formula RE 1-x AE x MnO y , where RE is a rare earth ion and AE is an alkaline-earth ion, with x in the range between 0.1 and 0.5. Controlling the oxygen content in the manganite includes forming an oxygen-rich RE 1-x AE x MnO y region where y is greater than 3. A low resistance results in the oxygen-rich manganite region. When y is less than 3, a high resistance is formed. More specifically, the process forms a low resistance oxygen-rich manganite region adjacent an oxygen-deficient high resistance manganite region.
申请公布号 DE602004011585(T2) 申请公布日期 2009.02.19
申请号 DE20046011585T 申请日期 2004.05.19
申请人 SHARP K.K. 发明人 HSU, SHENG TENG;ZHANG, FENGYAN
分类号 H01L27/10;H01L27/115;G11C11/15;G11C13/00;H01L27/01;H01L45/00;H01L49/00 主分类号 H01L27/10
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