发明名称 METHOD OF MEASURING PHYSICAL PROPERTY VALUE OF CELL AND SYSTEM FOR MEASURING PHYSICAL PROPERTY
摘要 First, the shape of a target cell is modeled and the complex permittivity response upon the application of an AC electrical field on the cell is determined by numerical analysis (Step S1). Based on the results, the permittivity spectrum is determined by numerical calculation while altering the membrane capacitance (Cm) and the cytoplasm permittivity (?i) (Step S2). By regressing the permittivity spectrum thus calculated to a permittivity relaxation equation, an increase in relative permittivity (?e) and the relaxation time (t) are determined (Step S3). Next, the dependency of (?e,t) on (Cm, ?i) is determined and a regression equation suiting for the shape of the target cell is formed (Step S4). The permittivity spectrum of the cell is measured and the measurement value is compared with the regression equation to thereby determine the membrane capacitance (Cm,exp') and cytoplasm permittivity (?i,exp) of the target cell (Step S5).
申请公布号 WO2009022536(A1) 申请公布日期 2009.02.19
申请号 WO2008JP63500 申请日期 2008.07.28
申请人 SONY CORPORATION;KATSUMOTO, YOICHI;HAYASHI, YOSHIHITO 发明人 KATSUMOTO, YOICHI;HAYASHI, YOSHIHITO
分类号 G01N22/00;G01N27/22;G01N33/48 主分类号 G01N22/00
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