摘要 |
The fuse cell architecture (371) for the presently claimed invention employs a multiple fuse structure (301, 302) architecture in lieu of a single fuse structure. As such, the terminals of these fuse structures that couple to other on-chip devices are always at ground potential throughout the application of programming voltage to the fuse pads (311). This approach overcomes previous single fuse problems owing to the fact that a sufficiently high programming voltage can be applied to blow fuse structures with unexpectedly high resistance without damaging nearby on-chip devices. Furthermore, even if one of the fuse structures (301, 302) possessed an abnormally high resistance which would not be blown under typical conditions, the desired circuit trimming result can still be achieved owing to the blowing of the other fuse structure in the fuse cell (371). |
申请人 |
HONG KONG APPLIED SCIENCE AND TECHNOLOGY RESEARCHINSTITUTE CO. LTD;KWONG, DAVID KWOK KUEN;WAN, HO MING KAREN;WAN, KAM CHUEN;NG, CHIK WAI |
发明人 |
KWONG, DAVID KWOK KUEN;WAN, HO MING KAREN;WAN, KAM CHUEN;NG, CHIK WAI |