| 摘要 |
<p>A test device, which examines a device under test, is provided with a multi-strobe generating unit for generating multiple strobe signals with different phases for every cycle of an output signal produced by the device under test, a plurality of timing comparators for acquiring a value of the output signal at timing for each of the multiple strobe signals, a changing point detection unit for producing changing point information to identify a strobe signal at a changing point of the output signal based on the value of the output signal acquired at the timing of each of the multiple strobe signals, a changing point storage for storing the input changing point information, a selection unit for selecting for every cycle of the output signal if the changing point information produced by the changing point detection unit is input to the changing point storage, and a calculation unit for calculating a jitter of the output signal based on the changing point information stored at the changing point storage.</p> |
