发明名称 |
SEMICONDUCTOR DEVICE, VOLTAGE SUPPLY SYSTEM, AND MANUFACTURING METHOD OF SEMICONDUCTOR DEVICE |
摘要 |
PROBLEM TO BE SOLVED: To provide a semiconductor device whose ESD resistance can be improved. SOLUTION: The semiconductor device 20 has an internal circuit 1 including an NMOS transistor 31, and an electrostatic protection circuit including a protection element 41 having a p-type well diffusion region 11 and a pair of n-type regions 12a and 12b opposed to each other at a predetermined mutual interval in the p-type well diffusion region 11. Then the p-type well diffusion region 11 of the protection element 41 included in the electrostatic protection circuit 2 is configured to have higher p-type impurity density than the p-type well diffusion region 4 of the NMOS transistor 31 included in the internal circuit 1. COPYRIGHT: (C)2009,JPO&INPIT
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申请公布号 |
JP2009038189(A) |
申请公布日期 |
2009.02.19 |
申请号 |
JP20070200641 |
申请日期 |
2007.08.01 |
申请人 |
SHARP CORP |
发明人 |
FUKUNAGA NAOKI |
分类号 |
H01L27/06;H01L21/822;H01L21/8238;H01L27/04;H01L27/092 |
主分类号 |
H01L27/06 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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