发明名称 Method for creating a memory defect map and optimizing performance using the memory defect map
摘要 A method for storing a memory defect map is disclosed whereby a memory component is tested for defects at the time of manufacture and any memory defects detected are stored in a memory defect map and used to optimize the system performance. The memory defect map is updated and the system's remapping resources optimized as new memory defects are detected during operation.
申请公布号 EP2026356(A2) 申请公布日期 2009.02.18
申请号 EP20080014502 申请日期 2008.08.14
申请人 DELL PRODUCTS, L.P. 发明人 NORROD, FORREST E.;PIKE, JIMMY D.;NEWELL, TOM L.
分类号 G11C29/44;G11C29/20 主分类号 G11C29/44
代理机构 代理人
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