发明名称 WORD LINE DRIVING CIRCUIT AND WORD LINE TEST METHOD USING THE SAME
摘要 A word line driving circuit and a word line test method using the same are provided to prevent previously an operational error by detecting correctly a word line of an abnormal state through a simple test mode. A word line driving circuit includes a driving unit(100) and a test control unit(200). The driving unit activates a word line in response to a word line driving signal. The test control unit performs an operation for floating the word line by controlling the driving unit according to a test mode signal(TM).
申请公布号 KR20090016789(A) 申请公布日期 2009.02.18
申请号 KR20070081027 申请日期 2007.08.13
申请人 HYNIX SEMICONDUCTOR INC. 发明人 LEE, JEONG WOO;MOON, HYUNG WOOK;CHOI, WON JUN
分类号 G11C8/08;G11C29/00 主分类号 G11C8/08
代理机构 代理人
主权项
地址