发明名称 |
WORD LINE DRIVING CIRCUIT AND WORD LINE TEST METHOD USING THE SAME |
摘要 |
A word line driving circuit and a word line test method using the same are provided to prevent previously an operational error by detecting correctly a word line of an abnormal state through a simple test mode. A word line driving circuit includes a driving unit(100) and a test control unit(200). The driving unit activates a word line in response to a word line driving signal. The test control unit performs an operation for floating the word line by controlling the driving unit according to a test mode signal(TM).
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申请公布号 |
KR20090016789(A) |
申请公布日期 |
2009.02.18 |
申请号 |
KR20070081027 |
申请日期 |
2007.08.13 |
申请人 |
HYNIX SEMICONDUCTOR INC. |
发明人 |
LEE, JEONG WOO;MOON, HYUNG WOOK;CHOI, WON JUN |
分类号 |
G11C8/08;G11C29/00 |
主分类号 |
G11C8/08 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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