| 摘要 |
A method and system for verifying an integrated circuit using a Model Checker at post-silicon time to improve post-silicon assertion-based verification. A dialog is established between the Model Checker and a fabricated integrated circuit under test (ICUT), to increase the state space which is explored. ICUT-based traces from the integrated current are generated, in part based on initial states and assertions provided by the Model Checker or by a user. The Model Checker verifies the integrated circuit by generating Model Checker-based traces from basic logic, which are reproductions of the ICUT-based traces.
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