发明名称 Method of making a semiconductor structure
摘要 The invention is directed to a structure and method of forming a structure having a sealed gate oxide layer. The structure includes a gate oxide layer formed on a substrate and a gate formed on the gate oxide layer. The structure further includes a material abutting walls of the gate and formed within an undercut underneath the gate to protect regions of the gate oxide layer exposed by the undercut. Source and drain regions are isolated from the gate by the material.
申请公布号 US7491623(B2) 申请公布日期 2009.02.17
申请号 US20070841018 申请日期 2007.08.20
申请人 INTERNATIONAL BUSINESS MACHINES CORPORATION 发明人 CHEN XIAOMENG;JENG SHWU-JEN;KIM BYEONG Y.;NAYFEH HASAN M.
分类号 H01L21/76 主分类号 H01L21/76
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