发明名称 Manufacturing process for a transistor made of thin layers
摘要 A process for fabricating a transistor that includes a gate located in the immediate proximity of a dielectric includes a step of etching a layer of gate material. The gate etching step includes plasma etching of the gate layer over the major portion of its thickness so as to laterally define the gate and chemical etching of a residual portion of the gate layer so as to define the gate as far as the dielectric.
申请公布号 US7491644(B2) 申请公布日期 2009.02.17
申请号 US20050223089 申请日期 2005.09.09
申请人 COMMISSARIAT A L'ENERGIE ATOMIQUE;ST MICROELECTRONICS SA 发明人 VINET MAUD;BESSON PASCAL;PREVITALI BERNARD;VIZIOZ CHRISTIAN
分类号 H01L21/44 主分类号 H01L21/44
代理机构 代理人
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