发明名称 Voltage generation circuit and semiconductor memory device including the same
摘要 A voltage generation circuit and semiconductor memory device including the same are provided. The voltage generation circuit includes: a voltage level detector, which detects a level of a first high voltage to generate a first high voltage level detection signal and detects a level of a second high voltage to generate a second high voltage level detection signal; a control signal generator, which generates at least four pumping control signals in sequence when the first high voltage level detection signal is active, generates a control signal when the first high voltage level detection signal is inactive, and generates a first one of the at least four pumping control signals in response to a level of a power supply voltage; and a voltage generator, which pumps a boost node in response to the at least four pumping control signals to generate the first high voltage and transmits charge from the boost node to a second high voltage generation terminal in response to the control signal to generate the second high voltage.
申请公布号 US7492647(B2) 申请公布日期 2009.02.17
申请号 US20080025442 申请日期 2008.02.04
申请人 SAMSUNG ELECTRONICS CO., LTD. 发明人 HWANG HYONG-RYOL;JUN YOUNG-HYUN
分类号 G11C7/00 主分类号 G11C7/00
代理机构 代理人
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