发明名称 Gated diode nonvolatile memory process
摘要 A gated diode nonvolatile memory cell with a charge storage structure includes a diode structure with an additional gate terminal. Example embodiments include the individual memory cell, an array of such memory cells, methods of operating the memory cell or array of memory cells, and methods of manufacturing the same.
申请公布号 US7491599(B2) 申请公布日期 2009.02.17
申请号 US20060421194 申请日期 2006.05.31
申请人 发明人
分类号 H01L21/8234 主分类号 H01L21/8234
代理机构 代理人
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