发明名称 PHASE CHANGE MEMORY DEVICE
摘要 A phase change memory device is provided to control separately a write operation mode of a set state and a write operation mode of a reset state. A cell array unit(10) includes phase change cells which are arranged in crossing regions between word lines and bit lines(BL0-BL2). A sense amplifier(S/A) senses and amplifies data of phase change resistance cells. A write driving unit(W/D) supplies write voltages corresponding to data to be written in the cell array unit. A write verification control unit is controlled by an activation control signal(Set_con) and outputs an enable signal by comparing data read through a sense amplifier with data to be written.
申请公布号 KR20090016195(A) 申请公布日期 2009.02.13
申请号 KR20070080667 申请日期 2007.08.10
申请人 HYNIX SEMICONDUCTOR INC. 发明人 KANG, HEE BOK;AN, JIN HONG;HONG, SUK KYOUNG
分类号 G11C13/02;G11C7/06;G11C7/22 主分类号 G11C13/02
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