发明名称 CRACK DEVELOPMENT LIFETIME PREDICTING SYSTEM OF PLANT STRUCTURE, AND METHOD THEREFOR
摘要 PROBLEM TO BE SOLVED: To accurately predict crack development lifetime of a plant structure by measuring with high accuracy the corrosion potential of the plant structure. SOLUTION: This crack development lifetime predicting system 30 of the plant structure for predicting the crack development lifetime of the plant structure in a corrosive environment has a corrosion potential measuring means for measuring the corrosion potential near a portion 35, whose lifetime in the plant structure is to be evaluated; and a lifetime prediction operation device 34 for predicting the crack development lifetime by using the measured corrosion potential and crack development characteristic data on a constituent material forming the portion whose lifetime is to be evaluated. The corrosion potential measuring means is formed, by arranging a sample electrode 31 constituted of the same material as the portion whose lifetime is to be evaluated and a reference electrode 32 for reference near the portion whose lifetime is to be evaluated, and is used for measuring the corrosion potential from the potential differences among the electrodes. COPYRIGHT: (C)2009,JPO&INPIT
申请公布号 JP2009030980(A) 申请公布日期 2009.02.12
申请号 JP20070191972 申请日期 2007.07.24
申请人 TOSHIBA CORP 发明人 ITO MIKIRO;KUBO TATSUYA;TANAKA NORIHIKO
分类号 G21C17/003;G21C17/02 主分类号 G21C17/003
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