发明名称 System and method for reducing pin-count of memory devices, and memory device testers for same
摘要 Methods, memory devices and systems are disclosed. In one embodiment, a non-volatile memory device receives command signals through the same input/output terminals that receive address signals and write data signals and transmit read data signals. The input/output terminals are connected to a multiplexer, which is responsive to a received mode control signal to couple the input/output terminals to either a command bus or an input/output bus. A latch in the memory device latches the command signals when the mode control signal causes the input/output terminals to be coupled to the input/output bus. As a result, the command signals continue to be applied to the command bus. When the mode control signal causes the input/output terminals to be coupled to the input/output bus, write data signals are clocked into the memory device and read data signals are clocked out of the memory device responsive to a received clock signal.
申请公布号 US2009040837(A1) 申请公布日期 2009.02.12
申请号 US20070891506 申请日期 2007.08.10
申请人 MICRON TECHNOLOGY, INC. 发明人 GATZEMEIER SCOTT;FISTER WALLACE;JOHNSON ADAM;LOUIE BEN
分类号 G11C7/02;G11C7/10 主分类号 G11C7/02
代理机构 代理人
主权项
地址