发明名称 OXIDE FILM FORMING METHOD AND APPARATUS THEREFOR
摘要 PROBLEM TO BE SOLVED: To form a film so as to obtain a uniform distribution of film thickness with respect to a large substrate. SOLUTION: Reaction gas is supplied to the substrate under a temperature region where a plurality of kinds of organic silicon is gasified. An oxide film forming apparatus 1 includes a treatment furnace 2 for storing the substrate 9. The reaction gas containing ozone gas and the plurality of kinds of organic silicon gas is supplied from a gas supply system 4 to the substrate 9. The treatment furnace 2 is adjusted to be the temperature region having the in-furnace temperature where the plurality of kinds of organic silicon is gasified. Tetramethylsilane and hexamethyldisilazane are indicated as examples for the plurality of kinds of organic silicon gas. COPYRIGHT: (C)2009,JPO&INPIT
申请公布号 JP2009032911(A) 申请公布日期 2009.02.12
申请号 JP20070195576 申请日期 2007.07.27
申请人 MEIDENSHA CORP 发明人 KAMEDA NAOTO;NISHIGUCHI TETSUYA;MORIKAWA YOSHIKI;HANAKURA MITSURU
分类号 H01L21/316;C23C16/42;H01L21/31 主分类号 H01L21/316
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