发明名称 |
OXIDE FILM FORMING METHOD AND APPARATUS THEREFOR |
摘要 |
PROBLEM TO BE SOLVED: To form a film so as to obtain a uniform distribution of film thickness with respect to a large substrate. SOLUTION: Reaction gas is supplied to the substrate under a temperature region where a plurality of kinds of organic silicon is gasified. An oxide film forming apparatus 1 includes a treatment furnace 2 for storing the substrate 9. The reaction gas containing ozone gas and the plurality of kinds of organic silicon gas is supplied from a gas supply system 4 to the substrate 9. The treatment furnace 2 is adjusted to be the temperature region having the in-furnace temperature where the plurality of kinds of organic silicon is gasified. Tetramethylsilane and hexamethyldisilazane are indicated as examples for the plurality of kinds of organic silicon gas. COPYRIGHT: (C)2009,JPO&INPIT
|
申请公布号 |
JP2009032911(A) |
申请公布日期 |
2009.02.12 |
申请号 |
JP20070195576 |
申请日期 |
2007.07.27 |
申请人 |
MEIDENSHA CORP |
发明人 |
KAMEDA NAOTO;NISHIGUCHI TETSUYA;MORIKAWA YOSHIKI;HANAKURA MITSURU |
分类号 |
H01L21/316;C23C16/42;H01L21/31 |
主分类号 |
H01L21/316 |
代理机构 |
|
代理人 |
|
主权项 |
|
地址 |
|