发明名称 METHOD TO MONITOR SUBSTRATE VIABILITY
摘要 An invention for detecting and reporting a condition is described. The components of the invention comprise an electronic package comprising a substrate with electrically conducting lines electrically connected to an integrated chip, and to a source of voltage. The integrated circuit chip is mounted onto a substrate and electrically connected to at least one electrically conducting line. A sensor, combined with a signal generator, connected to the substrate, is operable to generate an electrical signal upon detection of a condition selected from a condition of the substrate and a condition of an electrical connection to the substrate. The signal generator, after immediately receiving the aforesaid electrical signal from the sensor, emits the warning signal. The warning signal of indicated of an existing defect or a condition which can lower the longevity of the total electronic package.
申请公布号 US2009039911(A1) 申请公布日期 2009.02.12
申请号 US20070835008 申请日期 2007.08.07
申请人 DANG HIEN;SRI-JAYANTHA SRI 发明人 DANG HIEN;SRI-JAYANTHA SRI
分类号 G01R31/26 主分类号 G01R31/26
代理机构 代理人
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