发明名称 NON-VOLATILE MEMORY DEVICE AND METHOD OF FABRICATING THE SAME
摘要 <p>A non-volatile memory device and method of fabricating the same is provided to improve charge storage capacity by forming an oxide film that surrounds a nano crystal. In a non-volatile memory device and method of fabricating the same, a charge trapping layer(140) is formed on the semiconductor substrate. A charge trapping layer includes more than two laminated sub charge trap layers(142,144). A gate electrode is formed on the charge trapping layer, each sub charge trap layer includes a nano-crystal layer(120 NC) including a plurality of nano crystals and the dielectric layer(130) covering the nanocrystal layer. At least one of the sub charge trap layers includes the oxide film(127) that surrounds each nano-crystal. The tunnel layer(110) is interposed between the semiconductor board and the charge trapping layer. The blocking layer(150) is interposed between the charge trapping layer and the gate electrode.</p>
申请公布号 KR20090015665(A) 申请公布日期 2009.02.12
申请号 KR20070080188 申请日期 2007.08.09
申请人 SAMSUNG ELECTRONICS CO., LTD. 发明人 PARK, KWANG MIN;HWANG, KI HYUN;BAIK, SEUNG JAE;CHOI, SI YOUNG;NOH, JIN TAE;NAM, KOONG HYUN
分类号 H01L27/115 主分类号 H01L27/115
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