摘要 |
<P>PROBLEM TO BE SOLVED: To provide a security function for preventing a strip from being counterfeited by forming a sufficient number of contacts between a measuring instrument and a test strip. <P>SOLUTION: An analyte test strip 90 is provided with a generally planar substrate 5 and a plurality of electrically conductive areas arranged in the substrate to form five different electrically conductive parts 11, 13, 15, 17, and 19 including at least five contact lands each defining vertices of a polygon in which two contact lands are located in a single electrically conductive part. A system and a method utilizing such a test strip are also disclosed. <P>COPYRIGHT: (C)2009,JPO&INPIT |