发明名称 SUBSTRATE CLEANING APPARATUS AND SUBSTRATE PROCESSING SYSTEM EQUIPPED WITH THE SAME
摘要 PROBLEM TO BE SOLVED: To provide a substrate cleaning apparatus capable of fully purifying necessary parts of ends of a substrate, and a substrate processing system equipped with the substrate cleaning apparatus. SOLUTION: A cleaning processing unit SD1 is equipped with a spin chuck 521 for rotating a substrate W around a vertical axis passing through a center of the substrate W, while horizontally holding the substrate W. A bevel cleaning portion 530 is arranged in an outward of the spin chuck 521. The bevel cleaning portion 530 is provided with a cleaning brush 531. The cleaning brush 531 has a rotation symmetrical form to a vertical axis, and has an upper bevel cleaning side 531a, an end surface cleaning side 531b and a lower bevel cleaning side 531c. The end surface cleaning side 531b is a cylindrical surface where the vertical direction thereof is set as a shaft center. The upper bevel cleaning side 531a is inclined and prolonged from an upper end of the end surface cleaning side 531b to an outside upper part. The lower bevel cleaning side 531c is inclined and prolonged from a lower end of the end surface cleaning side 531b to an outside lower part. COPYRIGHT: (C)2009,JPO&INPIT
申请公布号 JP2009032889(A) 申请公布日期 2009.02.12
申请号 JP20070195034 申请日期 2007.07.26
申请人 SOKUDO:KK 发明人 NISHIYAMA KOJI;NISHIMURA JOICHI;YOSHII HIROYUKI
分类号 H01L21/304;G02F1/1333;G11B7/26 主分类号 H01L21/304
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