发明名称 METHOD FOR INSPECTING CURVED SURFACE STATE AND APPARATUS FOR INSPECTING APPEARANCE OF SUBSTRATE
摘要 PROBLEM TO BE SOLVED: To assure an inspection in accuracy by stably discriminating a tilt state of a surface, even when an illuminating device employing a point source such as an LED having a high directivity is used without introducing any diffusion plate. SOLUTION: A color camera 1 is disposed above a substrate S so that its light receiving surface may be opposite to a substrate surface, and the illuminating device 2 is disposed between the camera 1 and the substrate S, and then the inspection is carried out for a fillet 71 on the substrate S. Although the illuminating device 2 is configured such that respective color light beams of red, green and blue enter a view field of the camera 1 in different directions, by using LEDs 21R, 21G and 21B arranged concentrically, any diffusion plate is not disposed at each light emitting surface. In the inspection, high-luminance areas generated by respective illumination colors are extracted from an image formed by the camera 1, and the whole range, where these areas are distributed with spacings corresponding to distances between the LEDs, is specified as a color area corresponding to the illumination colors, and the number of component pixels in each color area is checked with a prescribed reference value. COPYRIGHT: (C)2009,JPO&INPIT
申请公布号 JP2009031228(A) 申请公布日期 2009.02.12
申请号 JP20070198083 申请日期 2007.07.30
申请人 OMRON CORP 发明人 KURIYAMA ATSUSHI
分类号 G01N21/956;G01B11/24 主分类号 G01N21/956
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