发明名称 IMPEDANCE MEASUREMENT PROCESS
摘要 A method for use in performing impedance measurements on a subject. The method includes, in a processing system, determining at least one first impedance value, measured at a site using a first electrode configuration, determining at least one second impedance value, measured at the site using a second electrode configuration, and determining the presence, absence or degree of an anomaly using the first and second impedance values.
申请公布号 CA2707419(A1) 申请公布日期 2009.02.12
申请号 CA20082707419 申请日期 2008.08.07
申请人 IMPEDIMED LIMITED 发明人 CORNISH, BRUCE HERBERT;THOMAS, BRIAN JOHN;SMITH, JYE GEOFFREY
分类号 A61B5/053 主分类号 A61B5/053
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