发明名称 PROBE
摘要 PROBLEM TO BE SOLVED: To provide a probe capable of coping with an excessive heating generation by giving a radiation function to the probe in order to prevent fusing of the probe caused by generation of a heavy current in the probe. SOLUTION: In this probe constituted of a support part to be mounted on a substrate of a probe card; an arm part extending from the support part; and a tip part provided on the tip of the arm part, to be brought into contact with an electrode which is an inspection object, the tip part comprises a contact part and a radiation fin. COPYRIGHT: (C)2009,JPO&INPIT
申请公布号 JP2009031059(A) 申请公布日期 2009.02.12
申请号 JP20070193663 申请日期 2007.07.25
申请人 JAPAN ELECTRONIC MATERIALS CORP 发明人 MORI CHIKAOMI;MORI RYUICHIRO;TARUMI KENICHI
分类号 G01R1/06;H01L21/66 主分类号 G01R1/06
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