发明名称 POSITIVE RESIST COMPOSITION, METHOD OF FORMING RESIST PATTERN, POLYMERIC COMPOUND, AND COMPOUND
摘要 A compound represented by general formula (I) shown below; and a polymeric compound having a structural unit (a0) represented by general formula (a0-1) shown below: wherein R1 represents a hydrogen atom, a lower alkyl group or a halogenated lower alkyl group; A represents a divalent hydrocarbon group of 2 or more carbon atoms which may have a substituent B represents a divalent hydrocarbon group of 1 or more carbon atoms which may have a substituent; and R2 represents an acid dissociable, dissolution inhibiting group.
申请公布号 US2009042131(A1) 申请公布日期 2009.02.12
申请号 US20080186233 申请日期 2008.08.05
申请人 TOKYO OHKA KOGYO CO., LTD. 发明人 SHIONO DAIJU;DAZAI TAKAHIRO;SHIMIZU HIROAKI
分类号 G03F7/004;C07C69/73;C08F24/00;C08F220/26;G03F7/20 主分类号 G03F7/004
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