发明名称 SEMICONDUCTOR DEVICE AND METHOD OF MANUFACTURING THE SAME
摘要 PROBLEM TO BE SOLVED: To provide a semiconductor device in which a sufficient stress is applied to a MOS transistor, and to provide a method of manufacturing the same. SOLUTION: The semiconductor device includes a semiconductor substrate 100; a gate structure 110 which includes a gate electrode 114 formed on the semiconductor substrate 100 and spacers 116, formed on the sidewalls of the gate electrode 114; source/drain regions 102 formed in the semiconductor substrate 100 on both the sides of the gate structure 110; and an etch stop film 130 formed on the gate structure 110 and includes a first region 130_1 formed on the spacers 116; and a second region 130_2, formed on the upper surface of the gate electrode, wherein the thickness of the first region 130_1 is 85% of the thickness of the second region 130_2 or smaller. COPYRIGHT: (C)2009,JPO&INPIT
申请公布号 JP2009033173(A) 申请公布日期 2009.02.12
申请号 JP20080192141 申请日期 2008.07.25
申请人 SAMSUNG ELECTRONICS CO LTD 发明人 WON LEE JOO;SHIN DONG SUK;KIM TAE KYUN
分类号 H01L29/78;H01L21/28;H01L21/283;H01L21/8238;H01L27/092;H01L29/417;H01L29/423;H01L29/49 主分类号 H01L29/78
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