发明名称 |
SEMICONDUCTOR DEVICE AND METHOD OF MANUFACTURING THE SAME |
摘要 |
PROBLEM TO BE SOLVED: To provide a semiconductor device in which a sufficient stress is applied to a MOS transistor, and to provide a method of manufacturing the same. SOLUTION: The semiconductor device includes a semiconductor substrate 100; a gate structure 110 which includes a gate electrode 114 formed on the semiconductor substrate 100 and spacers 116, formed on the sidewalls of the gate electrode 114; source/drain regions 102 formed in the semiconductor substrate 100 on both the sides of the gate structure 110; and an etch stop film 130 formed on the gate structure 110 and includes a first region 130_1 formed on the spacers 116; and a second region 130_2, formed on the upper surface of the gate electrode, wherein the thickness of the first region 130_1 is 85% of the thickness of the second region 130_2 or smaller. COPYRIGHT: (C)2009,JPO&INPIT
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申请公布号 |
JP2009033173(A) |
申请公布日期 |
2009.02.12 |
申请号 |
JP20080192141 |
申请日期 |
2008.07.25 |
申请人 |
SAMSUNG ELECTRONICS CO LTD |
发明人 |
WON LEE JOO;SHIN DONG SUK;KIM TAE KYUN |
分类号 |
H01L29/78;H01L21/28;H01L21/283;H01L21/8238;H01L27/092;H01L29/417;H01L29/423;H01L29/49 |
主分类号 |
H01L29/78 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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