发明名称 SEMICONDUCTOR INTEGRATED CIRCUIT AND DEBUGGING SYSTEM
摘要 This invention is to provide a technology for taking out trace information externally without lacking under the condition of limited output bandwidth. A semiconductor integrated circuit provided includes: a processing unit which can perform arithmetic processing according to a predetermined program and can output trace information with respect to the arithmetic processing; and a trace compression unit which can compress the trace information outputted from the processing unit. The trace compression unit includes a storage device, a comparator unit which can compare trace information stored in the storage device and the trace information newly outputted from the processing unit, and a trace information compression controller which can compress trace information to be externally outputted, based on the comparison result of the comparator unit. When a content of the trace information is in agreement with that of the trace information already outputted, information indicating the already-outputted trace information is outputted, accordingly the trace information is compressed.
申请公布号 US2009044059(A1) 申请公布日期 2009.02.12
申请号 US20080182183 申请日期 2008.07.30
申请人 RENESAS TECHNOLOGY CORP. 发明人 SAKIYAMA JUN;KATO NAOKI
分类号 G06F11/34 主分类号 G06F11/34
代理机构 代理人
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