| 摘要 |
The invention relates to a contactless measuring system having at least one test prod (28) forming part of a coupling structure for the contactless decoupling of a signal running on a signal waveguide (26), wherein the signal waveguide (26) is designed as a conductor of the electric circuit on a circuit board (24) and as part of an electric circuit (52). To this end, at least one contact structure (18; 44) is configured and disposed on the circuit board (24) such that said contact structure (18; 44) is galvanically separated from the signal waveguide (26), forms part of the coupling structure, is displaced completely within the near field of the signal waveguide (26), and has at least one contact point (42), which may be electrically contacted by a contact of the test prod (28). |
