| 摘要 |
PROBLEM TO BE SOLVED: To solve the problem of a pixel inspection method of prior art in which a defective pixel can not be detected when an adjoining pixel and peripheral pixel are not in the same color. SOLUTION: The pixel inspection method inspects whether the pixel to be inspected, in a photoelectric conversion element where a pixel of the same color adjoins, is a defective one or not. The method includes a first inspection process for detecting a first voltage difference between two voltages outputted from a first 1th color pixel adjoining to a first 2nd color pixel which is one of two or more 2nd color pixels and the pixel to be inspected, a second inspection process for inspecting a second voltage difference between two voltages outputted from a second 2nd color pixel other than the first 2nd color pixel among the two or more 2nd color pixels and the first 2nd color pixel, and a judging process for judging whether the pixel to be inspected is a defective one or not based on the first voltage difference and the second voltage difference. COPYRIGHT: (C)2009,JPO&INPIT
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