发明名称 TESTING METHOD AND DEVICE
摘要 PROBLEM TO BE SOLVED: To shorten the test time, while maintaining the quality of a specimen. SOLUTION: When testing whether a small number of specimens are operated normally by giving a plurality of test conditions thereto, a supply voltage margin for checking the voltage limit, capable of acquiring normal operation, is examined by changing a supply voltage to be supplied to the specimens in each of the plurality of testing conditions; and a test condition that showed poor supply voltage margin is determined, and succeeding tests of the specimens are performed following the determined test condition. COPYRIGHT: (C)2009,JPO&INPIT
申请公布号 JP2009031028(A) 申请公布日期 2009.02.12
申请号 JP20070193092 申请日期 2007.07.25
申请人 FUJITSU LTD 发明人 MAESAKI YOSHIHIRO;TESHIGAWARA HIROSHI;KODAIRA YUKIHIKO;SEKIGUCHI HISAE
分类号 G01R31/26;G01R31/30 主分类号 G01R31/26
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