发明名称 SOLID STATE IMAGE SENSOR
摘要 Forming an impurity region 6 and an impurity region 5 having a lower concentration than the impurity region 6 in a lower layer region of a gate electrode close to the boundary with a signal electron-voltage conversion section of a horizontal CCD outlet makes it possible to smooth a potential distribution at the time of transfer, improve the transfer efficiency, increase the number of saturated electrons and reduce variations in the transfer efficiency and variations in saturation.
申请公布号 US2009039395(A1) 申请公布日期 2009.02.12
申请号 US20080185314 申请日期 2008.08.04
申请人 MATSUSHITA ELECTRIC INDUSTRIAL CO., LTD. 发明人 TACHIKAWA KEISHI
分类号 H01L27/148;H01L21/339;H01L29/762;H04N5/335;H04N5/341;H04N5/369;H04N5/372 主分类号 H01L27/148
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