| 摘要 |
The invention relates to a method for the contact-free measurement of deformations of a surface of a measured object in which a series of individual images is captured in each of two time windows (T1, T2), wherein the image detector is displaced relative to the measured object and parallel to the detector surface thereof by an optical offset of the size of a fraction of a pixel up to a few pixels between every two individual image captures, the individual images of the first time window (T1) are processed in pairs with the individual images of the second time window (T2) to produce a set of individual deformation fields (18) and an average of the individual deformation fields (18) is calculated as an output deformation field (20). |
