发明名称 SEMICONDUCTOR DEVICE AND MANUFACTURING METHOD THEREFOR
摘要 <P>PROBLEM TO BE SOLVED: To provide a semiconductor device in which the performance of a transistor is enhanced and the reliability of a product is improved. <P>SOLUTION: The semiconductor device is provided with a semiconductor element 32, a frame material 36 provided at the upper part of the semiconductor element 32, with a hollow part 38 formed inside, and a mold resin layer 42 which covers the periphery of the frame material 36. The frame material 36 is made from resin films (first resin film 57a and second resin film 58a) containing the same resin. An active region 34 of the semiconductor element 32 is exposed in the hollow part 38. <P>COPYRIGHT: (C)2009,JPO&INPIT
申请公布号 JP2009032843(A) 申请公布日期 2009.02.12
申请号 JP20070194127 申请日期 2007.07.26
申请人 NEC ELECTRONICS CORP 发明人 KURAMOTO KAZUNORI
分类号 H01L23/29;H01L23/31 主分类号 H01L23/29
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