发明名称 Method for making a semiconductor device having a high-k gate dielectric layer and a metal gate electrode
摘要 A method for making a semiconductor device is described. That method comprises forming a first dielectric layer on a substrate, a trench within the first dielectric layer, and a second dielectric layer on the substrate. The second dielectric layer has a first part that is formed in the trench and a second part. After a first metal layer with a first workfunction is formed on the first and second parts of the second dielectric layer, part of the first metal layer is converted into a second metal layer with a second workfunction.
申请公布号 US2009042405(A1) 申请公布日期 2009.02.12
申请号 US20080157796 申请日期 2008.06.12
申请人 DOCZY MARK L;BRASK JUSTIN K;KAVALIEROS JACK;SHAH UDAY;METZ MATTHEW V;DATTA SUMAN;NAGISETTY RAMUNE;CHAU ROBERT S 发明人 DOCZY MARK L.;BRASK JUSTIN K.;KAVALIEROS JACK;SHAH UDAY;METZ MATTHEW V.;DATTA SUMAN;NAGISETTY RAMUNE;CHAU ROBERT S.
分类号 H01L21/469 主分类号 H01L21/469
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