摘要 |
Probe for measuring an electrical field, comprising at least one antenna (4), a detection circuit (71-77) for each antenna, which detection circuit is connected to the corresponding antenna for detecting an RF signal, and a housing (2, 3) in which is received a processing circuit (60-70, 81-93) for processing a detected signal, wherein the housing is conductive and has at least partially a substantially spherical surface for the purpose of forming a ground plane for the at least one antenna, wherein the detection circuit is arranged outside the housing and is coupled to the processing circuit via a feedthrough capacitor with a feedthrough terminal and a shield, wherein the feedthrough terminal connects the detection circuit conductively to the processing circuit and the shield is connected conductively to the conductive surface of the housing. |
申请人 |
DIJKSTRA ADVICE, RESEARCH & EMC ELECTRONICS B.V.;DIJKSTRA, PATRICK WALTER JOSEF;VAN PEER, ANTONIUS JOSEPHUS |
发明人 |
DIJKSTRA, PATRICK WALTER JOSEF;VAN PEER, ANTONIUS JOSEPHUS |