发明名称 PROBE FOR MEASURING AN ELECTRIC FIELD
摘要 Probe for measuring an electrical field, comprising at least one antenna (4), a detection circuit (71-77) for each antenna, which detection circuit is connected to the corresponding antenna for detecting an RF signal, and a housing (2, 3) in which is received a processing circuit (60-70, 81-93) for processing a detected signal, wherein the housing is conductive and has at least partially a substantially spherical surface for the purpose of forming a ground plane for the at least one antenna, wherein the detection circuit is arranged outside the housing and is coupled to the processing circuit via a feedthrough capacitor with a feedthrough terminal and a shield, wherein the feedthrough terminal connects the detection circuit conductively to the processing circuit and the shield is connected conductively to the conductive surface of the housing.
申请公布号 WO2009020388(A1) 申请公布日期 2009.02.12
申请号 WO2008NL50532 申请日期 2008.08.04
申请人 DIJKSTRA ADVICE, RESEARCH & EMC ELECTRONICS B.V.;DIJKSTRA, PATRICK WALTER JOSEF;VAN PEER, ANTONIUS JOSEPHUS 发明人 DIJKSTRA, PATRICK WALTER JOSEF;VAN PEER, ANTONIUS JOSEPHUS
分类号 G01R29/08 主分类号 G01R29/08
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