发明名称 |
PN DIODE OF PRAM AND METHOD OF MANUFACTURING THE SAME |
摘要 |
<p>A PN diode of pram and method of manufacturing the same is provided to secure uniform junction and junction depth without the concentration grade by forming polysilicon layer in which a SEG layer and P-type impurity are doped. In a PN diode of pram and method of manufacturing the same, an N type impurity region(105) is formed in the fixed region of the semiconductor substrate(100). The interlayer insulating film(110) is formed on the semiconductor substrate having N type impurity region. The photoresist pattern for the contact hole forming is formed on the interlayer insulating film. The interlayer insulating film is etched by using the photoresist pattern as a mask. After the photoresist pattern is removed, the cleaning process is performed to the substrate to remove native oxide film which is generated on the surface of the exposed N type impurity region.</p> |
申请公布号 |
KR20090015719(A) |
申请公布日期 |
2009.02.12 |
申请号 |
KR20070080281 |
申请日期 |
2007.08.09 |
申请人 |
HYNIX SEMICONDUCTOR INC. |
发明人 |
LEE, KEUM BUM;CHAE, SU JIN;LEE, MIN YONG |
分类号 |
H01L27/115 |
主分类号 |
H01L27/115 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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