| 摘要 |
PROBLEM TO BE SOLVED: To provide an IC tester which performs pattern data generation at high speed and requires only a short time for compiling. SOLUTION: The IC tester determines the quality of a device under test on the basis of the output of the device under test by providing a test signal to the device under test. The IC tester includes: a tester controller for compiling a test program in which an arithmetic expression necessary for test pattern generation is described; a hardware pattern generator in which arithmetic data obtained by the compilation by the tester controller is stored and which generates pattern data on the basis of instructions of the tester controller; a pattern memory for storing the pattern data generated by the hardware pattern generator; and a test circuit which generates the test signal on the basis of the pattern data read from the pattern memory and provides it to the device under test and determines the output of the device under test. COPYRIGHT: (C)2009,JPO&INPIT
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