| 摘要 |
A probe card for testing semiconductor devices is disclosed, which can precisely test semi-conductor chips, in which probes, probe bars, and a probe block housing of the probe card are improved, such that the durability of each part of the probe card is increased. The probe card comprises: a probe for absorbing and dispersing elasticity; a probe bar for receiving the probe and preventing the probe from bending; and a probe block housing for mounting probe blocks connected in parallel with each other. Each probe block is formed as the probe bars are assembled thereto.
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