发明名称 |
GROUP III NITRIDE SEMICONDUCTOR EPITAXIAL SUBSTRATE |
摘要 |
Disclosed is a group III nitride semiconductor epitaxial substrate, specifically an AlxGa1-xN epitaxial substrate (0 = x = 1), which is improved in crystal quality by suppressing generation of cracks and dislocations. More specifically disclosed is an AlxGa1-xN epitaxial substrate (0 < x = 1), which is useful for a light-emitting device of ultraviolet or deep ultraviolet region. The group III nitride semiconductor epitaxial substrate is composed of a base and an AlxGa1-xN (0 = x = 1) layer arranged on the base. This group III nitride semiconductor epitaxial substrate is characterized in that a layer, wherein crystals having -C polarity and crystals having +C polarity are mixed, is arranged on the base side of the AlxGa1-xN layer. |
申请公布号 |
WO2009020235(A1) |
申请公布日期 |
2009.02.12 |
申请号 |
WO2008JP64501 |
申请日期 |
2008.08.06 |
申请人 |
SHOWA DENKO K.K.;AMANO, HIROSHI;BANDO, AKIRA |
发明人 |
AMANO, HIROSHI;BANDO, AKIRA |
分类号 |
C30B29/38;C23C16/34;H01L21/205;H01L33/16;H01L33/32 |
主分类号 |
C30B29/38 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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