发明名称 SEMICONDUCTOR APPARATUS AND ITS MANUFACTURING METHOD
摘要 <p><P>PROBLEM TO BE SOLVED: To provide a semiconductor apparatus wherein the density of memory cells is easily increased, and to provide its manufacturing method. <P>SOLUTION: The semiconductor device includes a groove part 30 provided inside a semiconductor substrate 10, a charge storage layer 20 composed of an insulating film provided on both side faces of the groove part 30, a word line 22 embedded inside the groove part 30 through the charge storage layer, a source/drain region 12 provided inside the semiconductor substrate 10 on both sides of the groove part 30, a first wiring layer ML1 connected to one SD 13 of the source/drain region 12, and a second wiring layer ML2 connected to the other SD 12 of the source/drain region 12. <P>COPYRIGHT: (C)2009,JPO&INPIT</p>
申请公布号 JP2009032804(A) 申请公布日期 2009.02.12
申请号 JP20070193555 申请日期 2007.07.25
申请人 SPANSION LLC 发明人 IWASE SHIN
分类号 H01L21/8247;H01L27/115;H01L29/788;H01L29/792 主分类号 H01L21/8247
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