发明名称
摘要 An optical integrated oxide device uses a silicon-based functional matrix substrate on which both an oxide device and a semiconductor light emitting device can be commonly integrated with an optimum structure and a high density. A single-crystal Si substrate has formed on its surface a first region where a cleaned surface of the single-crystal Si substrate itself appears, and a second region in which a CeO2 thin film is preferentially (100)-oriented or epitaxially grown on the single-crystal Si substrate. A semiconductor laser is integrated in the first region by epitaxial growth or atomic layer bonding, and an optical modulation device or optical detection device made of oxides are formed in the second region, to make up an optical integrated oxide device. A MgAl2O4 thin film may be used instead of CeO2 thin film.
申请公布号 JP4221765(B2) 申请公布日期 2009.02.12
申请号 JP19970234217 申请日期 1997.08.29
申请人 发明人
分类号 H01L29/12;H01L39/24;H01L23/58;H01L27/15;H01L29/04;H01L31/036;H01L31/12;H01L31/153;H01L31/16;H01L39/02;H01S5/02;H01S5/026 主分类号 H01L29/12
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