| 发明名称 |
System for measuring the surface geometry and surface evenness of flat products |
| 摘要 |
The invention relates to a device for producing a pattern on a surface for measuring, using a projector and a slide. The invention also relates to various advantageous embodiments of the measuring system.
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| 申请公布号 |
US7489820(B1) |
申请公布日期 |
2009.02.10 |
| 申请号 |
US19990787172 |
申请日期 |
1999.09.07 |
| 申请人 |
VDEH-BETRIEBSFORSCHUNGSINSTITUT GMBH |
发明人 |
MULLER ULRICH;WINTER DETLEF;SONNENSCHEIN DETLEF;STOCKMEYER RUDOLF;PEUKER GUSTAV |
| 分类号 |
G01B11/04;G06K9/48;G01B11/24;G01B11/30 |
主分类号 |
G01B11/04 |
| 代理机构 |
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