| 摘要 |
A low coat type probe unit for LCD inspection is provided to simplify a manufacturing process by reducing the number of processes and to reduce a manufacturing cost, to improve productivity, and to secure competitive power thereby. A probe unit includes probe blades(100,200) and a wafer(4). The wafer is processed according to shapes of the probe blades. The probe unit is forming by combining the probe blades and the wafer with each other. The wafer is processed by using a wafer processing method according to the shapes of the probe blades having one or more fixed protrusions. The probe blades are fixed by the protruded blades. The probe blades are not moved by the protruded blades. |
