发明名称 High-heat-resistant semiconductor device
摘要 In a wide gap semiconductor device of SiC or the like used at a temperature of 150 degrees centigrade or higher, the insulation characteristic of a wide gap semiconductor element is improved and a high-voltage resistance is achieved. For these purposes, a synthetic high-molecular compound, with which the outer surface of the wide gap semiconductor element is coated, is formed in a three-dimensional steric structure which is formed by linking together organosilicon polymers C with covalent bonds resulting from addition reaction. The organosilicon polymers C have been formed by linking at least one organosilicon polymers A having a crosslinked structure using siloxane (Si-O-Si combination) with at least one organosilicon polymers B having a linear linked structure using siloxane through siloxane bonds.
申请公布号 US7488973(B2) 申请公布日期 2009.02.10
申请号 US20040562071 申请日期 2004.07.20
申请人 THE KANSAI ELECTRIC POWER CO., INC. 发明人 SUGAWARA YOSHITAKA
分类号 H01L29/08;C08G77/44;C08L83/10;H01L25/16;H01L29/24;H01L29/861;H01L31/0203;H01L33/44;H01L35/24;H01L51/00 主分类号 H01L29/08
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