发明名称 TAMPER-RESISTANT SEMICONDUCTOR DEVICE AND METHODS OF MANUFACTURING THEREOF
摘要 The invention relates to a tamper-resistant semiconductor device comprising a substrate (5) comprising an electronic circuit arranged on a first side thereof. An electrically- conductive protection layer (50, 50a, 50b) is arranged on a second side of the substrate (5) opposite to the first side. At least three through-substrate electrically-conductive connections (45) extend from the first side of the substrate (5) into the substrate (5) and in electrical contact with the electrically- conductive protection layer (50, 50a, 50b) on the second side of the substrate (5). A security circuit is arranged on the first side connected to the through- substrate electrically-conductive connections (45) and is arranged for measuring at least two resistance values (R12, R23, R34, R14, R13, R24) of the electrically- conductive protection layer (50, 50a, 50b) through the through-substrate electrically-conductive connections (45). The security circuit is further arranged for comparing the measured resistance values (R12, R23, R34, R14, R13, R24) with reference resistance values.
申请公布号 WO2009016589(A2) 申请公布日期 2009.02.05
申请号 WO2008IB53047 申请日期 2008.07.29
申请人 NXP B.V.;VAN GELOVEN, JOHANNES, A., J.;TUYLS, PIM, T.;WOLTERS, ROBERTUS, A., M.;VERHAEGH, NYNKE 发明人 VAN GELOVEN, JOHANNES, A., J.;TUYLS, PIM, T.;WOLTERS, ROBERTUS, A., M.;VERHAEGH, NYNKE
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