发明名称 METHOD OF POSITIONING PROBE CARD, AND ARRAY EQUIPMENT
摘要 PROBLEM TO BE SOLVED: To avoid an erroneous action as to a separation position and a contact position after changing a probe card, by a simple method. SOLUTION: The erroneous action is avoided after changing the probe card, as to the separation position approached in the first positioning process in order to produce a distance between a needle tip of the probe card and a stored substrate, the contact position approached in the second positioning process until bringing the probe card into contact with the stored substrate, and an image of a displayed needle, in vertical positioning of the probe card with respect to the test substrate, as a purpose. The purpose is attained by the fact that the stored contact position is image-formed when image-forming the needle tip, that the display of the contact position is changed until corresponding to a real height of a contact point proper to each probe card, and that setting therein is then stored as a new contact position. COPYRIGHT: (C)2009,JPO&INPIT
申请公布号 JP2009025284(A) 申请公布日期 2009.02.05
申请号 JP20080007493 申请日期 2008.01.17
申请人 SUSS MICROTEC TEST SYSTEMS GMBH 发明人 KANEV STOJAN;HANS-JURGEN FLEISCHER;STEFAN KREISSIG;KIESEWETTER JOERG
分类号 G01R31/28;G01R1/06;H01L21/66 主分类号 G01R31/28
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