发明名称 PLASMA PROCESSING EQUIPMENT AND PLASMA GENERATION CHAMBER
摘要 PROBLEM TO BE SOLVED: To prevent UV-rays generated from plasma from leaking outside, without affecting the state of plasma generated in the plasma generating chamber. SOLUTION: The plasma processing equipment is provided with a processing chamber 102 having a table 106 for mounting a wafer W, and a plasma generating chamber 104 interconnected therewith. The plasma generating chamber comprises a reaction vessel 140 having a tubular sidewall 142, a coil 116 wound around the sidewall and applied with predetermined high-frequency power, and a coating 150 covering the outer surface of the sidewall. The coating is constituted of a heat-resistant insulating material which shields the UV-rays from the plasma generated inside the reaction vessel. COPYRIGHT: (C)2009,JPO&INPIT
申请公布号 JP2009026885(A) 申请公布日期 2009.02.05
申请号 JP20070187262 申请日期 2007.07.18
申请人 TOKYO ELECTRON LTD 发明人 HAYASHI DAISUKE
分类号 H01L21/3065 主分类号 H01L21/3065
代理机构 代理人
主权项
地址