发明名称 DOT MEASUREMENT METHOD AND APPARATUS, PROGRAM, AND IMAGE FORMING APPARATUS
摘要 PROBLEM TO BE SOLVED: To provide a dot measurement technology for simultaneously and accurately measuring a dot impact location and a dot diameter (a droplet volume). SOLUTION: As a medium formed with line patterns obtained from dot rows corresponding to nozzles is carried in the first direction, the line patterns are imaged while an imaging apparatus having rows of light receiving elements intersecting the line patterns at a predetermined angle is moved in the second direction different from the first direction. A plurality of profile graphs, each representing a fluctuation in image signal values of one-dimensional pixel row intersecting each line pattern, are obtained. From each profile graph, an extremum position corresponding to the concentration center of each line pattern, the first and second edge locations corresponding to left and right edges in the line pattern are calculated. A line center approximation line, a first edge approximation line and a second edge approximation line are obtained by the least-square method. The dot diameter is obtained from a correlation between a previously-known line width and the dot diameter. COPYRIGHT: (C)2009,JPO&INPIT
申请公布号 JP2009025094(A) 申请公布日期 2009.02.05
申请号 JP20070187242 申请日期 2007.07.18
申请人 FUJIFILM CORP 发明人 YAMAZAKI YOSHIAKI
分类号 G01B11/08;B41J2/01;G01B11/00 主分类号 G01B11/08
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