APPARATUS AND METHOD FOR TESTING SEMICONDUCTOR DEVICES
摘要
An apparatus for testing semiconductor devices includes a table having receptacles for trays holding semiconductor devices to be tested. An interface is positioned between the receptacles and at least one test device. The interface is customized to electrically connect the semiconductor devices to the at least one test device. The apparatus also includes a press that moves toward the table and applies force to each of the semiconductor devices, thereby securing the semiconductor devices in place for testing and securing the electrical connection to the interface.
申请公布号
WO2007103551(A3)
申请公布日期
2009.02.05
申请号
WO2007US06026
申请日期
2007.03.07
申请人
TESTMETRIX, INC.;COJOCNEANU, CHRISTIAN, O.;IOSUB, DORU, G.